Frontier Semiconductor, Inc, (FSM), offers a range of advanced metrology products and solutions for semiconductor, LED, Solar, FPD, Data Storage and MEMS applications. We have over 25 years experience in stress measurement, film adhesion testing, wafer topography metrology, and electrical characterization. Our latest offerings include unique technology to meet the metrology needs of 3DIC manufacturing. We have shipped our first 450mm wafer tools.
FSM has local sales and support offices in all major semiconductor clusters. Other areas are covered by a network of local representatives.
Management driven by Customer satisfaction offers the Best-Known-Method in our customized metrology solutions.
Partnership with major OEMs to enable 300mm and 450mm eco-system and to align with fabs' cost reduction initiative.
IV-CV measurements of dielectric gate materials.
In scribe line measurements allow for probing on production wafers.