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Welcome to Frontier Semiconductor
offers a range of advanced metrology products and solutions for semiconductor and MEMS applications, including measurement systems for film stress, wafer bow, local stress & strain in Si, SiGe and SOI using Raman Spectroscopy characterization techniques for new films, such as Thermal Desorption Spectroscopy, Quantitative Adhesion Testers, Ultra-thin Wafer Substrate
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Products
Optical
Measurement Techniques