World-wide support
Sample Analysis Service Available:
FSM offers to provide measurements on customer wafers:
(ask for pricing)
Wafer Flatness & Film Stress on FSM 128, 128L
Stress hysteresis up to 500 C in FSM500
Stress hysteresis, out-gassing, densification in FSM900 Film
Adhesion in FSM MELT or 4 point bend Wafer
Substrate thickness, roughness in FSM 413
USJ Sheet Resistance & Leakage in FSM RsL
Metal Contamination in wafer in FSM MC
ASK FOR LITERATURE
For details, please contact: FSM at 408-432-8838 or
email to FSM100@Frontiersemi.com
