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Frontier Semiconductor, Inc FSM, was founded in 1988. It currently offers a range of advanced metrology products for semiconductor applications, including Measurement Systems for Film Stress, Material Characterization for new films, Thermal Desorption Spectroscopy, Quantitative Adhesion Testers, Wafer Substrate Thickness, Whole Wafer Surface Roughness, Non contact Electrical Characterization systems for Sheet Resistance and Leakage Current Measurements for USJ and Metal Contamination, diffusion length measurements for patterned wafers. Systems are supported globally by FSM sales and service team. The company is based in San Jose, CA and is privately held.